IEC 61508 revision 2 published in 2010 had around 27 pages of semiconductor related content spread across the 7 parts but primarily in parts 2 and 7. IEC 61508 revision 3 planned for publication in late 2026 or early 2027 will include a new part, IEC 61508-2-1, dedicated to the functional safety of semiconductors. It runs to over 100 pages. The goal of this new normative part of the standard is to interpret the requirements from parts 1, 2 and 3 for semiconductor devices. Interesting new material includes definitions for class 0, 1 and 2 semiconductors, clarified restrictions on the use of standard (class 0) semiconductors in a safety system, the expansion of the detailed design measures to analog and mixed signal semiconductors, a new approach to analyzing on-chip redundancy, information on the use of STL(software test libraries) and the use of coded processing. This presentation will give an overview of this exciting new part of the standard and is relevant to both semiconductor manufacturers, those using semiconductors in their designs and independent assessors.